The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2000
Filed:
Aug. 01, 1997
Weon Seob Shim, Chungcheongnam-do, KR;
Weon Sik Park, Seoul, KR;
Chan Ho Choi, Chungcheongnam-do, KR;
Yong Su Kwon, Chungcheongnam-do, KR;
Samsung Electroincs Co., Ltd., Suwon, KR;
Abstract
A test board is provided to reduce the test time for integrated circuits required by the necessity to stabilize bias voltages applied to IC devices. The test board includes a capacitor connected to specific input terminals of the IC device and a capacitor charging circuit connected between the input terminals of the IC device and the capacitor charging circuit via switches. A testing method using this circuit includes the steps of mounting a test board to a tester, placing the IC device onto the test board, charging the capacitor by driving the capacitor charging circuit, and testing the IC devices according to test items. The test board used in this method includes application circuits for applying bias voltages to the IC device, a capacitor connected between the IC device and a ground terminal, and a capacitor charging circuit for charging the capacitor.