The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2000
Filed:
Feb. 25, 1998
Applicant:
Inventors:
Yuji Sugiyama, Tokyo, JP;
Keiji Tanabe, Tokyo, JP;
Assignee:
Ando Electric Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
714718 ; 714724 ; 714 42 ;
Abstract
A failure-data storage system is disclosed which is able to prepare data accumulated from a multiple data bit device test. Failure-data from the memory tester 1 is, before being stored in memory IC 6, logically added to one previous cycle failure-data with the same address by OR gate 12, and the result is input to F/F 13. The output of the F/F 13 is input to memory IC 6 when 3 state buffer 14 is in an enabled state and is fed back to the OR gate 12. Furthermore, each of the data bit of memory IC has data controller 10-1, 10-2, 10-3, and 10-4 as explained above.