The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2000
Filed:
Dec. 08, 1997
Applicant:
Inventor:
Masaaki Sugimoto, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
714 46 ; 709203 ;
Abstract
A failure analyzer has an electric characteristic inspection system for producing pieces of electric test data information for integrated circuit devices fabricated on a semiconductor wafer, a visual inspection system for producing pieces of appearance test data information for the semiconductor wafer and a data analyzing system for producing a failure analysis report from the pieces of electric test data information and the pieces of appearance test data information, and the data analyzing system is implemented by using a client-server network technology so as to increase a data processing capability depending upon the amount of data to be analyzed.