The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2000
Filed:
Jun. 14, 1994
David Addy Bishop, Austin, TX (US);
Timothy Manfred Holck, Austin, TX (US);
Telford Knox, Jr, Austin, TX (US);
Charles Lincoln Raby, Austin, TX (US);
Robert Charles Shay, Boca Raton, FL (US);
Mark David Turner, Austin, TX (US);
Stephen Asa Yeamans, Round Rock, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system resource monitor is provided to capture a data processing system's internal resource utilization, such as memory, CPU, or peripheral device availability/utilization. The captured `state` of the data processing system's resources is maintained in real-time, while the impact on the system's performance in providing such information is kept to a minimum. This is accomplished through a combination of various techniques, including specialized device drivers for the respective devices coupled with a unique data reduction technique. Such techniques include filtering only events which are of interest and combining similarly related events to reduce data processing requirements. This real-time support provides an immediate and accurate representation of the internal operations of the data processing system. Further, these resources can monitored at the process level of a multiprocessing system. This captured data can be used by an application or control program to identify, isolate, and fine-tune the data processing system's resources to improve the overall efficiency of the system being monitored.