The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2000

Filed:

Feb. 25, 1998
Applicant:
Inventors:

Anil K Jain, Okemos, MI (US);

Lin Hong, Lansing, MI (US);

Rudolf Maarten Bolle, Bedford Hills, NY (US);

Sharathchandra Umapathirao Pankanti, Mt. Kisco, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382125 ; 382173 ;
Abstract

The invention is a system and method for determining a correspondence between a point selected from a set of points extracted from one image and an another point selected from the second set of points extracted from another image based on similarity of relationships of attributes associated with segments attached to the points.


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Jain, Anil. (2000). Determining a point correspondence between two points in two respective (U.S. Patent No. 6049621). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6049621

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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