The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2000
Filed:
Feb. 05, 1997
Jonathan D Courtney, Dallas, TX (US);
Dinesh R Nair, Austin, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
Object detection for scene change analysis is performed by a statistical test applied to data extracted from two images taken from the same scene from identical viewpoints. It is assumed that a single change region corresponding to an object that is present in one image but absence in the other is given. In the case of TV data, the test consists of measuring the coincidence of edge pixels in each image with the boundary of the change region. In the case of IR data, the tests consist of measuring the pixel intensity variance within the change region in each image.
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