The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2000

Filed:

Oct. 01, 1997
Applicant:
Inventors:

Gersh Zvi Taicher, Houston, TX (US);

Arcady Reiderman, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324303 ;
Abstract

A method for determining nuclear magnetic resonance longitudinal relaxation time of a medium. The method includes magnetically polarizing nuclei in the medium along a static magnetic field, momentarily inverting the magnetic polarization of the nuclei within each one of a plurality of different spatial volumes within the medium, transversely magnetizing the nuclei in each one of the spatial volumes after an individual recovery time corresponding to each one of the spatial volumes, and measuring an amplitude of a magnetic resonance signal from each one of the spatial volumes.


Find Patent Forward Citations

Taicher, Gersh. (2000). Multiple frequency method for nuclear magnetic resonance longitudinal (U.S. Patent No. 6049205). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6049205

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…