The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2000
Filed:
Sep. 08, 1997
Hunter Ellinger, Austin, TX (US);
Scientific Measurement System, Austin, TX (US);
Abstract
A method of comparison includes the step (14) of obtaining an interior and exterior image of an object to be compared. A standard of measurements for an acceptable object is created in step (12). An automatic comparison is made in step (14) of the image of the object to be compared with the standard and a comparison report is generated in step (16) listing deviations of the image of the object to be compared from the standard for the acceptable object. An x-ray CT scanner (76) may be utilized for obtaining the images and the standard may be derived from an actual, acceptable object or from design specifications for acceptable objects. In a preferred embodiment, CAD designs are utilized to create the standards for comparison.