The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2000
Filed:
Oct. 05, 1998
Korea Atomic Energy Research Institute, Daejeon, KR;
Korea Electric Power Corporation, Seoul, KR;
Abstract
The present invention relates to an apparatus for measuring surface relief profile of an object by projecting a line-shaped laser sheet beam in triangulation method and anisotropic magnification optics for improving the measurement resolution. The purpose of the present invention is to provide a system or an apparatus capable of measuring relief profiles with anisotropic magnification optics composed with one or more positive and one or more negative cylindrical lenses, which allows it to obtain magnified images along the direction vertical to the length-wise direction of the image of a line-shaped laser sheet beam for higher resolution in the relief profile measurements along the direction parallel to the length-wise direction of a line-shaped laser sheet beam image to measure the same range of area as the range without anisotropic magnification optics.