The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2000
Filed:
Dec. 02, 1994
Applicant:
Inventor:
Jay M Wardle, Seattle, WA (US);
Assignee:
Hewlett-Packard Company, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324615 ; 324617 ; 702 67 ; 702109 ;
Abstract
The phase response of a network is measured at uniform frequency intervals. A linear regression analysis is performed on samples of the phase response measured at frequencies within an aperture centered on a group delay frequency to obtain an estimate of the group delay of the network at that frequency. The process is repeated for a sequence of group delay frequencies to determine a trace of the group delay of the network across a range of frequencies.