The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2000
Filed:
May. 07, 1999
Applicant:
Inventor:
Samir F Bassily, Los Angeles, CA (US);
Assignee:
Hughes Electronics Corporation, El Segundo, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73849 ; 73853 ;
Abstract
A system for simultaneously measuring strains in a test member includes spatial-position members which are coupled to different portions of the test member and first and second displacement sensors which are spaced apart by a sensor space and coupled to the spatial-position members. Linear and bending deformations of the test member are calculated as functions of the responses of the displacement sensors and of the sensor space.
Bassily, Samir. (2000). Strain measurement system and method (U.S. Patent No. 6044713). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6044713
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile