The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2000

Filed:

Jul. 13, 1998
Applicant:
Inventors:

Vasilis Z Marmarelis, Irvine, CA (US);

Chrysostomos L Nikias, Rancho Palos Verdes, CA (US);

Dae Cheol Shin, Diamond Bar, CA (US);

Assignee:

Multispec Corporation, Huntington Beach, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S / ; G04B / ;
U.S. Cl.
CPC ...
702190 ; 702191 ; 342159 ; 367 87 ;
Abstract

A signal processing method for use in echo-location systems (radar, sonar, laser radar) to obtain accurate estimates of the target reflectivity sequence in a random (non-Gaussian) noise environment, including ambient noise, reverberation, and clutter. The method derives the statistical characteristics of the random background environments and then constructs and maximizes the corresponding approximate likelihood function using iterative methods. The approximate maximum likelihood estimates are generated on the basis of an approximation of the ideal likelihood function which is maximized using computationally efficient algorithms.


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