The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2000

Filed:

Apr. 15, 1998
Applicant:
Inventors:

Kofi Korsah, Knoxville, TN (US);

William B Dress, Knoxville, TN (US);

Cheng Yu Ma, Oak Ridge, TN (US);

Michael R Moore, Corryton, TN (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01R / ;
U.S. Cl.
CPC ...
702 76 ; 73 2406 ; 324 7619 ; 324 7623 ; 324 7624 ;
Abstract

A method for sensing and analyzing data with surface acoustic wave (SAW) devices comprises the steps of: propagating a sampling signal at a fundamental frequency through a SAW device coated for selective adsorption; measuring at least one parameter of at least one higher order harmonic of the fundamental frequency sampling signal; exposing the coated SAW device to enable the selective adsorption; measuring the at least one parameter of the at least one higher order harmonic of the fundamental frequency sampling signal after the exposing step; comparing the measurements of the at least one parameter of the at least one higher order harmonic before and after the exposing step; and, deriving a result of the selective adsorption based upon the comparing step. The at least one parameter is harmonic power and harmonic frequency. The at least one higher order harmonic is one or more odd harmonics.


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