The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2000
Filed:
Jan. 08, 1998
Applicant:
Inventors:
Denis Mazuet, Paris, FR;
Patrick Bertrand, Issy-les-Moulineaux, FR;
Do Quyen Phan, Chauconin-Neufmontiers, FR;
Werner Mohr, Zwiesel, DE;
Assignee:
Essilor International, Charenton Cedex, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G01B / ;
U.S. Cl.
CPC ...
356354 ; 356127 ; 356124 ;
Abstract
A fringe deflectometry apparatus illuminates an optical component to be measured using radiation with a known wavefront, deflects the radiation after it has been reflected or transmitted by the optical component to be measured, and materializes a reference ray. Transverse aberration of the reference ray after reflection or transmission by the optical component is measured. A deflectometry method using the apparatus enables an absolute phase reference to be provided.