The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2000
Filed:
Mar. 30, 1998
Hewlet-Packard Company, Palo Alto, CA (US);
Abstract
This invention relates to a wavemeter and an apparatus for the adjustment of the wavelength of a laser source. The invention proposes a wavemeter comprising an optical component, which generates an optical beam with a wavelength which depends on the optical power of the incident beam to be measured. To increase the precision of the wavelength measurement, the wavemeter is provided with a second measurement channel, whose optical signals are retarded by .pi./2 relative to the optical signals in a first measurement channel. The first and second measurement channels either each comprise a different etalon or the wavemeter comprises a single retardation plate to obtain the desired retardation. After calibration of the wavemeter, the optical power of the beam generated by the optical component is measured, the measured value of the optical power is compared with the power values of the calibration data and the wavelength in the calibration data corresponding to the measured value of the optical power is determined. A controller, such as a PC, compares the measured wavelength with the desired wavelength and automatically adjusts the wavelength of the signals generated by the laser source.