The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2000

Filed:

Apr. 17, 1997
Applicant:
Inventors:

Robert H Cadwallader, Clinton Corners, NY (US);

Thomas Morrison, Pleasant Valley, NY (US);

Klaus Probst, Herrenberg, DE;

William A Yager, Salt Point, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324758 ; 324761 ;
Abstract

A substrate tester and method of testing are disclosed in which the tester moves a substrate to be tested into a precise location within the tester prior to making contact with fragile tester pins. The substrate is then clamped in a precise X-Y location relative to the tester contact pins, also without making contact with the tester pins. Next the substrate top surface is moved quickly to a precise Z-axis location, whereupon the tester contact pins are finally applied to the substrate using Z-axis motion only. In addition, a mechanism is included that features a cam-pivot arm micro-switch combination to sense when a product is not properly positioned in or missing from the test station.


Find Patent Forward Citations

Loading…