The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2000
Filed:
Jan. 22, 1998
Hitachi, Ltd., Tokyo, JP;
Abstract
There are provided body movement measuring means for measuring the movement of an object of inspection and control means for controlling at least means for applying a gradient magnetic field and means for applying a high frequency magnetic field. The control means performs a sequence for measuring an echo by applying a phase-encoding gradient magnetic field quantity a plurality of times with the same phase-encoding gradient magnetic field quantity and repeatedly executes the sequence while varying the phase-encoding gradient magnetic field quantity. When the phase-encoding gradient magnetic field quantity is small, the number of execution times of the sequence executed with the same phase-encoding gradient magnetic field quantity in a case where the phase-encoding gradient magnetic field quantity is small is set to be larger than a case where the phase encoding gradient magnetic field quantity is large to reduce the probability of omission occurrence of echo measurement in the small phase-encoding magnetic field which exerts a large influence on an image, thereby suppressing the occurrence of an artifact.