The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2000
Filed:
Dec. 14, 1998
Applicant:
Inventors:
Peter Menke, Botzow, DE;
Thomas Bosselmann, Marloffstein, DE;
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ; G01J / ;
U.S. Cl.
CPC ...
3242441 ; 250225 ; 324 96 ; 324202 ; 356364 ;
Abstract
A method for temperature calibration of an optical magnetic field measurement array and a measurement array calibrated by the method include an optical series circuit having a first optical transmission path, a first polarizer, a Faraday sensor device, a second polarizer, and a second optical transmission path. The optical series circuit is temperature-calibrated by adjusting the polarizer angles of the two polarizers in a special way. The calibration method functions even if the intrinsic axis of the linear double refraction in the sensor device is unknown.