The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2000
Filed:
Oct. 21, 1997
Applicant:
Inventors:
Toshio Takama, Nara, JP;
Yung Xiang Wang, Shiga, JP;
Masao Kono, Osaka, JP;
Xiaoming Dou, Osaka, JP;
Assignee:
Kyoto Daiichi Kagaku Co., Ltd., Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q / ; C07H / ; C07H / ; C12N / ;
U.S. Cl.
CPC ...
435-6 ; 536 231 ; 536 243 ; 935 76 ; 935 77 ; 935 78 ;
Abstract
A method for measuring the concentration of polynucleotide in a sample comprising the steps of: (1) preparing a sample, a Raman scattering active agent capable of bonding to a polynucleotide and a surface-enhanced Raman scattering (SERS) active substrate capable of capturing the agent; (2) mixing the sample, the agent and the substrate to capture the agent which has not been bonded to polynucleotide on the surface of the substrate; (3) irradiating the mixture; and (4) measuring the SERS radiation which is generated by the agent captured on the surface of the substrate.