The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2000
Filed:
Nov. 12, 1998
Toshifumi Mihashi, Tokyo, JP;
Katsuhiko Kobayashi, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
Disclosed is an optical characteristic measuring apparatus for precisely measuring optical characteristics of an eye to be examined by projecting a specific pattern on the retina of the eye. In particular, the measuring apparatus is capable of measuring an irregular astigmatism component. In this apparatus, an illuminating optical system illuminates the retina of an eye to be examined via an illuminating state changing unit capable of changing an illuminating state created by light rays emitted from the light source; a light receiving optical system receives light rays reflected back from the retina of the eye and guides the reflected light rays to a light receiving unit; and an optical characteristic arithmetic unit determines optical characteristics of the eye on the basis of a signal outputted from the light receiving unit. The above illuminating state changing unit changes, on the basis of the optical characteristics obtained by the optical characteristic arithmetic unit, the illuminating state of the illuminating optical system such that the illuminating optical system illuminates a minute region on the retina of the eye.