The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2000
Filed:
Jun. 25, 1998
Applicant:
Inventors:
Kiichiro Takahashi, Kawasaki, JP;
Naoji Otsuka, Yokohama, JP;
Kazuhiro Nakata, Tokyo, JP;
Atsushi Arai, Kawasaki, JP;
Kentaro Yano, Yokohama, JP;
Osamu Iwasaki, Tokyo, JP;
Daigoro Kanematsu, Yokohama, JP;
Masao Sasaki, Kawasaki, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J / ; B41J / ;
U.S. Cl.
CPC ...
347 15 ; 347 43 ;
Abstract
Random masks each having a given size and defining a random array of non-record pixel locations and record pixel locations are placed in association with record areas in mask registers. Using the placed masks, record data is thinned-out and supplied to a recording head. An image is then recorded. Thus, since thinning-out masks do not have periodicity, any inherent density nonuniformity loses periodicity. Consequently, high-definition images can be produced.