The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2000

Filed:

Nov. 03, 1997
Applicant:
Inventor:

Alan M Yamauchi, Saratoga, CA (US);

Assignee:

Sun Microsystems, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M / ;
U.S. Cl.
CPC ...
714752 ;
Abstract

A method and apparatus for detecting and correcting single bit errors, detecting double bit errors, and detecting multiple bit errors within a nibble of a data field comprising 135 data bits and 9 check bits. 9 check bits are generated based on 135 data bits. The 9 check bits are appended to the data bits and the cumulative data field is checked for errors. An error detection syndrome is generated that indicates whether an error has occurred and whether the error is correctable. Check bit generation and error detection syndrome generation is accomplished based on the ordering in an ECC code matrix.


Find Patent Forward Citations

Yamauchi, Alan. (2000). Error detection and correction code for data and check code fields (U.S. Patent No. 6041430). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6041430

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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