The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2000
Filed:
Nov. 30, 1992
Applicant:
Inventors:
Mamoru Kurata, Tokyo, JP;
Shin Nakamura, Tokyo, JP;
Assignee:
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
714 33 ;
Abstract
A method of analyzing the operation of a semiconductor device by solving simultaneous equations consisting of electron- and hole-transport equations and Poisson's equation, by means of a computer, thereby to accomplish the modeling of the semiconductor device. The method comprises the steps of: rewriting simultaneous equations to the following equations (a), (b), (c) containing artificial time differential terms dp/dt, dn/dt, d.psi./dt and sensitivity coefficients .lambda.p, .lambda.n, and .lambda..psi.:
Kurata, Mamoru. (2000). Method of analyzing semiconductor device operation, method of analyzing (U.S. Patent No. 6041424). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6041424
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile