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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6041177 B1

PDFFull Text
Date of Patent:
Mar. 21, 2000

Filed:

Sep. 12, 1997

Program analyzing apparatus which categorizes variables into domains and

Applicant:
Inventors:

Keiko Kawabe, Kawasaki, JP;

Akihiko Matsuo, Kawasaki, JP;

Minako Kimura, Kawasaki, JP;

Kenji Nagahashi, Kawasaki, JP;

Sanya Uehara, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:

Staas & Halsey, LLP

Primary Examiner:

Eric W Stamber

Assistant Examiner:

Brian Sattizahn

Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395704 ; 395705 ; 714 38 ;
Abstract

A variable type analyzing unit detects the data types of each variable. A variable length analyzing unit detects the length of each variable. A partial reference unit detects the range of a partial reference when part of a variable is referred to. An internal layout analyzing unit checks the range to which data is actually referred and to which data is actually assigned based on the information on each variable obtained by the above units. A domain analyzing unit categorizes variables used in a target program by domain based on the ranges.

Find Patent Forward Citations

Kawabe, Keiko. (2000). Program analyzing apparatus which categorizes variables into domains and (U.S. Patent No. 6041177). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6041177

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