The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2000
Filed:
Nov. 26, 1997
Sunil C Shah, Mountain View, CA (US);
Pradeep Pandey, San Jose, CA (US);
Mark A Erickson, Sunnyvale, CA (US);
Voyan Technology, Santa Clara, CA (US);
Abstract
A method for processing signals and controlling a physical system in which measurements are obtained at different time scales and/or different space scales. Signals generated from the physical system are processed by first creating a first dynamic model at a first time/space scale that consists of a first set of parameters, a first set of states and a first set of inputs. A second dynamic model at a second time/space scale is also created and consists of a second set of parameters, a second set of states and a second set of inputs. At least one of the first set of parameters in the first dynamic model are computed from the second set of states in the second dynamic model. A second estimator is then created to produce estimates of the second set of states using the second dynamic model, measurements from the first physical system at the second time scale. A first estimator is also created to produce estimates of the first set of states using the first dynamic model, measurements from the first physical system at the first time scale, and the estimates from the second estimator.