The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2000
Filed:
Jul. 29, 1997
Ralph G Isaacs, Cincinnati, OH (US);
Joseph M Portaz, Hamilton, OH (US);
General Electric Company, Cincinnati, OH (US);
Abstract
A method of computed tomographic inspection which uses a Euclidian reference ply model having a corresponding Non-Euclidian ply model which includes reference model plies to extract intensity data from Euclidian slice data (typically having a pixel format) derived from multiple slice X-ray scans using an X-ray scanning system such as the CT system. The multiple slice data is analyzed to determine intensity values for points corresponding to a subject ply of a corresponding reference model ply. The reference model may be a predetermined model such as a mathematically described CAD model file or based on such a CAD model. A preferred method of the present invention includes a transformation of the CAD model data to register the CAD model data to multiple slice data of a standardized object to generate the reference model. Intensity values preferably gray scale pixel values are assigned to points on the reference ply model from the slice data and displayed as a Non-Euclidian image on a monitor.