The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2000

Filed:

Apr. 15, 1997
Applicant:
Inventors:

Srinivas Ramanathan, Sunnyvale, CA (US);

Edward H Perry, Mountain View, CA (US);

Tai Jin, San Mateo, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J / ;
U.S. Cl.
CPC ...
370241 ; 714 25 ;
Abstract

A scheme is described for a data service system having a number of modules. Some of the modules are interdependent. To measure the status of an individual module, the scheme first collects measurements from a number of measurement routes that involve the module. Then the scheme analyzes the interdependencies of the measurements to determine the status of the individual module. The scheme may also determine status of the data service system with a minimal number of measurement routes. This is done by determining (1) all possible measurement routes, (2) determining the dependency between the modules and the measurement routes, and (3) analyzing the dependency to select minimal number of the measurement routes. The scheme can diagnose whether a module is a problematic module or not by analyzing a number of measurements that involve the module. If one of the measurements is good, the module is identified as non-problematic. The data service system may also include a test target coupled to a networking module of the data service system to allow service test signals to be measured through the network module.


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