The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2000

Filed:

Feb. 26, 1998
Applicant:
Inventors:

Michihiko Iida, Kanagawa, JP;

Tetsuji Kawashima, Kanagawa, JP;

Shoji Sato, Kanagawa, JP;

Shozo Masuda, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369 50 ; 369 59 ; 369 48 ;
Abstract

A disc apparatus in which recorded data can be correctly reproduced despite occurrence of a low-reliability area at a specified position on a disc on which synchronization signals are recorded. A comparison error signal between the playback RF signals read out from a disc 100 and channel clocks PLCK enters a VCO 15 via a phase/frequency comparator 12. A VCO 15 generates PLCK at a frequency corresponding to the voltage of the comparison error signal. A data detection unit 16 takes out data from the playback RF signals. If a Sync pattern detection interpolation unit 17 detects the Sync pattern correctly from this data, the above comparison error signal is directly fed to the VCO 15 and, if otherwise, the sample-and-hold unit 14 holds the voltage of the comparison error signal by control signals from a controller 20. At this time, interpolation of the Sync patterns by the Sync pattern detection interpolation unit 17 is discontinued.


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