The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2000
Filed:
Jul. 01, 1997
Xiaolu Chen, Saline, MI (US);
Cybernet Systems Corporation, Ann Arbor, MI (US);
Abstract
Material defects and damage are detected and evaluated by stressing the material while looking for flaw-induced anomalies. In one embodiment, a thermal stressing unit is used to provide a slight temperature difference between a localized region and surrounding areas, with the change in temperature being used to reveal the defects and damage using a fringe pattern generated through the interference between two coherent laser beams. A sensor head and a head-mounted display (HMD), interfaced to a computer, power supply, and control electronics are used to measure the derivative of out-of-plane displacement with respect to an image shearing direction so as to generate a display of the fringe pattern, preferably in three dimensions through a displacement or depth map.