The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2000

Filed:

May. 06, 1998
Applicant:
Inventors:

John T Caulfield, Santa Barbara, CA (US);

Richard H Wyles, Carpinteria, CA (US);

John D Schlesselmann, Goleta, CA (US);

Kevin L Pettijohn, Goleta, CA (US);

Assignee:

Raytheon Company, Lexington, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
2502081 ; 250332 ; 348311 ;
Abstract

An IR-FPA (10) having a plurality of radiation detectors (2a) and a multipurpose ROIC (2) is disclosed. The radiation detectors (2a) are organized as a two dimensional array. The multipurpose ROIC (2) includes a plurality of readout circuit unit cells, individual ones of which are coupled to individual radiation detectors (2a) for receiving electrical signals therefrom. Each of the readout circuit unit cells operates in one of a first mode to provide a corrected m frame averaged output signal (Vout.sub.THPF) or, a second mode to provide a subframed averaged output signal (Vout.sub.2). In the first operating mode, a high pass filtering circuit subtracts a low frequency charge pedestal from the electrical signal to form the corrected m frame averaged output (Vout.sub.THPF). Also disclosed is a method for operating an array of radiation detectors (2a) which includes the steps of: within a sampling period that defines a frame comprised of subframe periods, generating an electrical signal in individual ones of the radiation detectors, the electrical signals being generated in response to incident radiation; in a first operating mode, forming a high pass filtered output signal (Vout.sub.THPF) from electrical signals generated during at least one frame period; in a second operating mode, forming a subframe averaged output signal (Vout.sub.2) from electrical signals generated during a frame period; and reading out, in the first operating mode, the high pass filtered output signal (Vout.sub.THPF) or, in the second operating mode, the subframe averaged output signal (Vout.sub.2).


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