The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2000
Filed:
Feb. 18, 1998
David C Long, Wappingers Falls, NY (US);
Thomas P Moyer, Lagrangeville, NY (US);
Keith C O'Neil, Hughsonville, NY (US);
Charles H Perry, Poughkeepsie, NY (US);
Glenn A Pomerantz, Kerhonkson, NY (US);
James R Case, Brackney, PA (US);
Laszlo Kando, Hopewell Junction, NY (US);
John E Kozol, Binghamton, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for testing the integrity at least two test objects, each object is made of a plastically deformable material, by a. contacting a moving means with the objects at a first point in time, the moving means at a first position and the objects at a first position, the moving means having a shaped portion; b. shifting at least a portion of the objects to a second position at a second time, subsequent to the first time, wherein at least a portion of the objects were displaced during the interval between the first time and the second time; c. evaluating the objects after the shifting in step b. 22.