The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2000

Filed:

Sep. 25, 1997
Applicant:
Inventors:

Adalberto G Yanes, Rochester, MN (US);

James Richard Pollock, San Jose, CA (US);

James C Chen, San Jose, CA (US);

David C Giese, Pleasanton, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
714-1 ; 711112 ;
Abstract

System and method aspects for avoiding data corruption during data transfer in a disk array environment are described. In a circuit aspect, an integrity checker includes counting logic for counting fields in the data being transferred. The integrity checker further includes comparison logic for comparing a constant value and a value in a predetermined field of data being transferred. Combinational logic is further included and coupled to the comparison logic and counting logic, wherein when the comparison logic results in a miscompare and the counting logic is at a predetermined count value, the integrity checker circuit aborts data transfer. In a method aspect, the method includes providing an integrity checker at an interface to an array of disk drives, and performing data validity determinations on data passing across the interface with the integrity checker, wherein invalid data is not transferred.


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