The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2000
Filed:
Mar. 26, 1997
Applicant:
Inventor:
Hans-Georg Baumann, Jena, DE;
Assignee:
Carl Zeiss Jena GmbH, Jena, DE;
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359368 ; 359381 ;
Abstract
An arrangement for generating a defined longitudinal chromatic aberration in a beam path of a confocal microscope. The arrangement includes using a confocal microscope with a microscope objective, and supplementary optics which are arranged in the imaging beam path of the microscope objective. The supplementary optics include at least two dual lens optical elements for generating the longitudinal chromatic aberration.