The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2000

Filed:

Jul. 16, 1997
Applicant:
Inventor:

Toshiyuki Ohtaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324535 ; 324533 ;
Abstract

The object of the present invention is to offer a transmission line propagation delay time measuring device capable of reducing the measurement errors due to attenuation in transmission lines and allowing precise measurement of the transmission line propagation delay time. The invention comprises a test signal generating circuit 1 for generating a test signal for measuring the propagation delay time in a transmission line 3, a transmission line 3 having one end connected to the test signal generating circuit 1 via a measurement point at which the propagation delay time is measured and the other end open, a timing measuring circuit 5 for measuring the time required for the voltage at the measurement point 2 to reach a predetermined value, a data table 7 for storing transmission line attenuation values and measurement errors obtained by simulating the transmission line delay time measuring device as corrective data, and a computing circuit 6 for performing a propagation delay time corrective procedure by calculating a propagation delay time based on measurement values measured in the timing measuring circuit 5 and referring to the data table 7.


Find Patent Forward Citations

Loading…