The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2000
Filed:
Mar. 16, 1998
Kinpui Chan, Yamagata, JP;
Koji Satori, Yamagata, JP;
Biophotonics Information Laboratories, Ltd., Yamagata, JP;
Abstract
There is disclosed an optical measurement device which is based on optical interference and it uses a light beam which is radiated to and transmitted through or reflected by a sample, especially a light scattering medium to optically measure the sample. The amount of signal lights effective for optical heterodyne detection is increased, while speckle noises are averaged out. On an observation plane of a concerned point arranged are plural detector elements. From signals obtained by the respective detector elements, an optical signal of the concerned point is obtained.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile