The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2000
Filed:
Jul. 11, 1996
Marco Jean-Pierre Leiner, Grax, AT;
James K Tusa, Alpharetta, GA (US);
AVL Medical Instruments AG, Schaffhausen, CH;
Abstract
Quality control of an analyzing system that includes a portable analyzer with insertable single-use cartridges whose sample chamber contains optical and/or electrochemical sensors is accomplished by bringing the sensors in the single-use cartridge into contact, or are in contact with, a calibrating and/or conditioning medium, the calibrating and/or conditioning medium exhibiting chemical and/or physical parameters which influence the characteristic of at least one of the sensors. Just before a sample is measured, the sensors are contacted with a quality control liquid which is identical with the calibrating and/or conditioning medium within a predetermined desired range of accuracy for the sample components to be measured, as regards the chemical and/or physical parameters influencing the characteristic of at least one sensor during calibration and/or conditioning. The instantaneous control values obtained on the basis of the calibration values are subsequently compared to known target control values.