The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2000

Filed:

Sep. 29, 1997
Applicant:
Inventors:

Barry E Caldwell, Whitewater, KS (US);

Craig C McCombs, Wichita, KS (US);

Assignee:

LSI Logic Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
714 52 ;
Abstract

In a computer system having a peripheral bus and a peripheral device coupled together, a method for testing data transfer integrity of the peripheral bus includes the step of transferring first data to the peripheral device via the peripheral bus. Another step of the method includes generating a first error signal if the first data was corrupted during the first data transferring step. The method also includes updating a counter in response to generation of the first error signal. The method further includes generating a second error signal if the counter exceeds a predetermined threshold. Moreover, the method includes the steps of transferring the first data in a first manner, and in response to generation of the second error signal, transferring second data to the peripheral device in a second manner that is different than the first manner. The difference between the first manner and the second manner may include a difference in transfer rate and/or a difference in bus width.


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