The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2000
Filed:
Feb. 01, 1999
Kumiko Otaki, Edogawa-Ku, JP;
Nikon Corporation, , US;
Abstract
A reflected light differential interference microscope (100) having a birefringent optical member (B). Each birefringent optical member has a ray-separating plane (Q.sub.B) that intersects the optical axis (A2') at an intersection point (P.sub.B) at a first angle (.beta.) with respect to a reference plane (P.sub.2) oriented perpendicular to the optical axis. The microscope further includes an objective lens (113) having a focal point (F.sub.113) along the optical axis. The birefringent optical member is designed so as to be movable along a line oriented at a second angle (.gamma.) with respect to the reference plane in a manner that maintains the intersection point and the focal point substantially coincident. This allows for the color of the image (115) to be varied without degrading the image quality.