The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2000
Filed:
Nov. 17, 1997
Ernest David Shields, San Jose, CA (US);
Joyce Lee Norell, Ben Lomond, CA (US);
SmithKline Diagnostics, Inc., Fullerton, CA (US);
Abstract
A closure and a device for use with a closure are described. The closure includes a first member having an interrupted beveled edge, a second member having an undercut edge, and optionally a base member to which the second member is fixed. The first member is adapted to be received with the interrupted beveled edge retained by the undercut edge. A test device can include such a closure and can also include a hinge between the first and second members. Test elements, such as a chromatographic medium, an absorber, an applicator, or a sample application zone, can be disposed on the first member and/or the base member and can be brought into opposition by closing the first member with the closure. The beveled edge is interrupted by one or more uncut portions or bridges. A testing device according to the present invention can perform a number of types of immunoassays, including unidirectional assays, bidirectional assays, and assays employing a split flow path.