The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 29, 2000
Filed:
Jun. 22, 1994
Hong-Wen Liu, Hsin-Chu, TW;
Chun-Chen Lin, Hsin-Chu, TW;
Other;
Abstract
The present invention is related to a method and an apparatus for distortion detection of a scanned image. The method for distortion detection of a scanned image comprises: a) obtaining a first value representative of a first scanning position for the image; b) obtaining a second value representative of a second scanning position for the image; and c) comparing the first and second values to determine there is a line-drop situation when the first and second values obtained in a sequential order are not predeterminedly sequential values. The apparatus for distortion detection of a scanned image comprises a value generator generating two values respectively representative of two scanning positions for the image, and a comparing unit for comparing the two values to determine there is a line-drop situation when the two values obtained in a sequential order are not predeterminedly sequential values. The present invention uses a different comparing logic and a simple structure apparatus to achieve the purpose of distortion detection of a scanned image and compensating the image when there is line-drop detected to make the scanning result more perfect.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile