The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 29, 2000

Filed:

Oct. 15, 1997
Applicant:
Inventors:

Subutai Ahmad, Palo Alto, CA (US);

Kevin L Hunter, San Jose, CA (US);

Assignee:

Electric Planet, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382154 ; 382284 ; 382195 ;
Abstract

Methods and apparatuses are disclosed for determining one or more characteristics of a sub-image within an electronic image. In one embodiment, the present invention includes an alpha image generator and a characterizer. The alpha image generator provides an alpha image of the subject being characterized, separated from a background of the input image. In another embodiment, the alpha image generator also may provide a summed area table. The characterizer determines a characteristic of the subject from the alpha image. In another embodiment, a first characteristic of the subject is derived from the alpha image. The characterizer determines a second characteristic based upon the first characteristic. In yet another embodiment, the determination of the second characteristic is simplified by eliminating all the unlikely estimates of the second characteristic in the overall potential estimates of the second characteristic. In one embodiment, simplification is accomplished by segmenting the alpha image and eliminating portions of the alpha image that do not correspond to the second characteristic. In a further embodiment, the remaining potential estimates are scored based upon the correlation of the alpha image with the estimate, the best estimate having the best score.


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