The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 29, 2000
Filed:
Nov. 23, 1998
Applicant:
Inventor:
Miwako Torii, Aichi, JP;
Assignee:
Nidek Co., Ltd., Aichi, JP;
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351205 ;
Abstract
A method for analyzing an image of a fundus to analyze an optic disc on the basis of the image of the fundus includes: a first step of producing a disc line and a cup line on a same planar image, on the basis of the image of the fundus; a second step of obtaining a longest distance in a predetermined direction of each of a disc region determined by the produced disc line and a cup region determined by the produced cup line; and a third step of computing a C/D ratio on the basis of longest distances of the regions in the predetermined direction.