The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 29, 2000

Filed:

Mar. 19, 1998
Applicant:
Inventors:

Kurt Seitz, Widnau, CH;

Horst Adams, St. Gallen, CH;

Markus Hasler, Montlingen, CH;

Assignee:

Wagner International AG, Alstatten, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F / ; F16K / ;
U.S. Cl.
CPC ...
7386152 ; 7386102 ; 137487 ;
Abstract

A device and method of measuring and controlling the flow rate of a fluid determine analog process variables which are dependent on a volumetric flow of the fluid, and the values thus obtained are converted into digital values, the latter being corrected by an offset value which is dependent on a change of the operating parameters of analog components of the measuring system occurring in the course of operation of the system. To obtain the offset value, an analog process variable is determined during interruptions in operation, when the volumetric flow is zero, and converted into a digital value. This digital value is memorized and used as the offset value when operations are resumed. The digital corrected measured values are supplied to a digital signal processor and the flow rate control is carried out digitally. Preferably, at least one parameter memory is provided for the digital control.


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