The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 29, 2000
Filed:
May. 19, 1998
Keisuke Munetaka, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
In an inventive analyzing system (e.g. liquid chromatograph), an analyzing schedule includes data on whether or not to carry out a self-check for each sample, and data on what process to follow the self-check according to the check result, in addition to data on the analyzing order and analyzing condition of a series of analyses on a plurality of samples. In carrying out the analysis according to the schedule, a self-check is carried out after an analysis of a sample for which the self-check is scheduled. In the self-check, a data collecting unit 17 collects data on the degree of degradation of expendable parts and on the wavelength error of a spectrophotometric detector 14, etc., and a checking unit 18 detects abnormality by comparing the data to preset tolerable values. For example, in the case where the process specified to follow the detection of abnormality is 'stop analysis on detecting abnormality', a control unit 15 stops each part of the system so that the rest of the analyses are deferred.