The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2000

Filed:

Aug. 02, 1996
Applicant:
Inventor:

Oliver Mihatsch, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
706 15 ; 706 16 ; 706 19 ; 706 23 ; 706 25 ; 706906 ;
Abstract

A sequence of measured quantities is determined for a chemical reactor and a data generator generates a curve in normal coordinates from a respective predetermined normal form that describes a type of critical state. Each normal form is imaged onto the sequence of measured quantities by neural networks whereby a respective neural network is allocated to a data generator. The imaging is optimized by applying parameter optimization methods. The neural network that converges best through use of parameter optimization method describes the critical state that lies closest to the actual state of the chemical reactor.


Find Patent Forward Citations

Mihatsch, Oliver. (2000). Method for determining state parameters of a chemical reactor with (U.S. Patent No. 6029157). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6029157

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…