The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2000

Filed:

Jan. 19, 1998
Applicant:
Inventors:

Theodore E Kirchner, Weston, MA (US);

Paul Burstein, Winchester, MA (US);

Assignee:

Foster-Miller, Inc., Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
378 22 ; 378 21 ;
Abstract

The present invention is related to laminographic apparatus and method for imaging individual layers of a multilayer structure, for example the individual layers of a composite, with capabilities for imaging in multiple dimensions or along arbitrary surfaces within the space of the structure. A source of radiation and an areal detector are moved relative to a test specimen positioned therebetween such that a magnified two dimensional image of the test specimen is obtained at the detector. A single translational pass of the test specimen through the source/detector combination provides sensitivity to patterns in the test specimen which have small scale features lying in a direction parallel to the direction of the pass. An image with sensitivity to features in two perpendicular directions is obtained by taking passes in both directions, no mechanical registration between the perpendicular passes being required. To reconstruct a point along the pass, only local mechanical registration (over for example an inch or so) between the source, test specimen and detector is required for each pass; each point being reconstructed from a predetermined number of images taken over the short distance for which local mechanical registration was required. One or more surfaces of the test specimen may be reconstructed using digitized data of the images.


Find Patent Forward Citations

Kirchner, Theodore. (2000). High resolution areal tomosynthesis (U.S. Patent No. 6028910). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6028910

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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