The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2000
Filed:
Sep. 04, 1997
Yasuyuki Oishi, Kawasaki, JP;
Kazuo Nagatani, Kawasaki, JP;
Hidenobu Fukumasa, Yanai, JP;
Hajime Hamada, Kawasaki, JP;
Yoshihiko Asano, Kawasaki, JP;
Fujitsu Limited, Kanagawa, JP;
Abstract
SIR measurement for measuring S/N ratio, which is the ratio of a desired signal power to noise power, or S/I ratio, which is the ratio of desired signal power to interference signal power, uses a signal-point position altering unit for taking absolute values of an I component (in-phase component) and Q component (quadrature component) of a received signal to convert the received signal to a signal in the first quadrant of an I-Q orthogonal coordinate system, and for squaring the average value of the converted signal to obtain first average power (desired power) S, a received-power arithmetic unit for calculating the average value of the square of the received signal to obtain second average power, and for subtracting the desired power S from the received power to obtain noise power or interference power I, and a SIR arithmetic unit for calculating S/N ratio or S/I ratio from the desired signal power S and noise power or interference signal power I, and for outputting the ratio calculated.