The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2000
Filed:
Aug. 14, 1998
Applicant:
Inventors:
Bernhard Ganswein, Aalen, DE;
Andrea Mahler, Oberkochen, DE;
Gerhard Moller, Aalen, DE;
Petra Ludwig, Ochsenberg, DE;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G02B / ; F21V / ;
U.S. Cl.
CPC ...
359589 ; 359359 ; 359577 ; 359580 ; 359581 ; 359586 ; 359588 ;
Abstract
An operation microscope includes an illuminating device and an interference filter in the illuminating beam of the illuminating device. The interference filter is suitable for incorporation into the operation microscope. In order to prevent the yellow tinge that is present in long-known UV interference filters, the interference layer applied directly to the carrier substrate is a layer between 8 and 12 nm thick of yttrium fluoride, thorium fluoride, lanthanum fluoride or cerium fluoride.