The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2000
Filed:
Dec. 08, 1997
Takao Minami, Tokyo, JP;
Nobuaki Takeuchi, Tokyo, JP;
Naoyuki Nozaki, Osaka, JP;
Koichi Shinozaki, Osaka, JP;
Takamu Genji, Osaka, JP;
Ando Electric Co., Ltd., Tokyo, JP;
The Kansai Electric Power Co., Inc., Osaka, JP;
Abstract
A multi-branched optical line testing apparatus can automatically detect a faulty line in multi-branched optical lines and the distance to the fault point. An optical pulse is introduced to the branch point of optical fibers and is reflected inside the respective optical fibers. The waveform of the returning response light is analyzed by an optical time-domain reflectometer (OTDR) measuring apparatus to detect a fault in the respective optical fibers and to determine the fault point. The OTDR measuring apparatus periodically converts the response light which is returned from the respective optical fibers into a digital waveform data group, calculates the attenuation ratios of the respective optical fibers by performing separation analysis of the digital waveform data group, and determines the faulty line and the position of the fault point based on the change of the attenuation ratio of the respective optical fibers.