The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2000
Filed:
Nov. 28, 1994
Applicant:
Inventor:
Boyd B Bushman, Lewisville, TX (US);
Assignee:
Lockheed Fort Worth Company, Fort Worth, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
324750 ; 324753 ;
Abstract
A system for evaluating defects and determining unknown parameters is provided which includes an AC source (10) coupled to a device under test (36). A radiation detector (16) detects radiation emitted from interrupted electrons flowing in the surface of the device under test (36). An analyzer (18) is coupled to the detector (16) for analyzing the output of the detector (16). A processor and memory system (38) is coupled to the analyzer (18) to assist in making determination as to defects or unknown properties of the device under test (36).